Surface metrology has to increasingly deal with the presence of sub-micron thick films, which are now being used on products well beyond semiconductor devices. Sub-micron films may be incidental – for ...

(Nanowerk News) Optical measurement techniques collecting light intensity in the far-field such as conventional and confocal microscopy or coherence scanning interferometry (CSI) enable fast and ...

This experimental setup – based on coherence scanning interferometry – was developed at INRiM. Fiber sensing systems integrate photonic and optoelectronic components that are matched with fiber optics ...