Yahoo Finance

Advantest Introduces Industry’s First Flexible DUT Interface Enabling Increased Parallelism on V93000 EXA Scale Test Systems

TOKYO, May 10, 2022 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has launched its DUT Scale Duo interface for the V93000 EXA Scale SoC test ...
Semiconductor Engineering

Balancing Parallel Test Productivity With Yield & Cost

Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...
Semiconductor Engineering

Promises and Perils of Parallel Test

Testing multiple devices at the same time is not providing the equivalent reduction in overall test time due to a combination of test execution issues, the complexity of the devices being tested, and ...
Electronic Design

FormFactor test platform features fine-pitch, high-parallelism, high-temperature

FormFactor (www.formfactor.com) has introduced a test platform for automotive devices that can reduce wire bond or system-on-chip device pad pitch as low as 60µm, increase the number of die tested in ...
Financial Post

Advantest Introduces Industry's First Flexible DUT Interface Enabling Increased Parallelism on V93000 EXA Scale Test Systems

New DUT Scale Duo Interface Extends DUT Board Space for High-Volume Testing and is Compatible with Existing DUT Boards TOKYO, May 10, 2022 (GLOBE NEWSWIRE) — Leading semiconductor test equipment ...