JTAG Functional Test(JFT) provides developers with a new method for preparing tests fornon-boundary-scan portions of their boards. JFT simplifies tests ofmixed-signal parts such as ADCs and DACs, ...

As design size and complexity increase, so too does the cost of test. Both the design community and the test industry are looking at various approaches to lower the cost of manufacturing test. This ...

Design for Test (DFT) managers often must make difficult and sometimes costly trade-offs between test implementation effort and manufacturing test cost. The traditional method for evaluating these ...

Design for test (DFT) has been around since the 1960s. The technology was developed to reduce the cost of creating a successful test for an IC. Scan design, fault models, and automatic test pattern ...

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

Over the last twenty years, structural testing with scan chains has become pervasive in chip design methodology. Indeed, it’s remarkable to think that most electronic devices we interact with today ...

The testing and verification of semiconductor chips was a prominent topic at this year’s European Test Systems (ETS) conference, especially in the area of Design-for-Test (DFT) tools and techniques.

XJTAG selected by ARM due to power, performance, versatility, and cost-effectiveness With XJTAG, ARM is meeting its target for 90 percent test coverage for digital connects and ten-minutes-per-board ...

TOKYO, May 08, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today unveiled SiConic Test Engineering (TE), the newest addition to the SiConic ...