In the modern era, where meeting high performance and low power targets for any complex SoC (System on Chip) is very tough, testing the SoC has become even more challenging. The purpose of several DFT ...

When a global provider of air traffic, navigation, and landing system solutions began implementing its next-generation system, limitations of an existing test and debug methodology directly impacted ...

ScanExpress JET bridges the gap between JTAG and functional test methods, providing a superior solution to customers requiring the highest test coverage ScanExpress JET carries existing boundary-scan ...

Boundary scan, based on IEEE Standard 1149.1 and related specifications, has become widely used to solve difficult test problems on complex PCBs. The difficulties arise due to lack of access needed by ...