The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.
Today's methods for BER (bit-error-rate) testing of high-speed serial links such as PCIe and SATA rely on predetermined patterns that don't represent real-world situations. These patterns use a ...
Complex system-on-chip (SoC) devices make every stage of the development flow harder, and the challenges continue even after the silicon is fabricated. Automatic test equipment (ATE) screening for ...
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